AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.

Sessions focused on problem solving strategies, resolution requirements and potential artifacts in data collection and analysis. Several walkthrough examples from various fields were demonstrated.

Topics

• Atomic force microscopy (AFM).
• Optical spectroscopy (Raman, FTIR, ellipsometry, etc.) and microscopy (confocal, near-field scanning).
• Surface analysis: Auger electron spectroscopy, secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS).
• Scanning and transmission electron microscopy (SEM, TEM, STEM).
• X-ray diffraction (XRD), reflectivity (XRR), micro-XRD and small-angle x-ray scatterings (SAXS).
• Special session on sample preparation and analysis of biological materials.

MRL staff scientists with 20+ years of hands-on experience in materials characterization with industrial scientists introducing new technology and metrology.

Researchers should cite this work as follows:

• Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin (2015), "[Illinois] Advanced Materials Characterization Workshop 2015," https://nanohub.org/resources/22636.

  BibTex | EndNote

1. advanced
2. characterization
3. Illinois
4. materials
5. NanoBio Node at Illinois
6. workshop
7. 2015