[Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer
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Dr. Scott Speakman was previously a postdoctoral researcher jointly in the Department of Materials Science and Engineering and Oak Ridge National Laboratory (ORNL). He was in charge of the diffraction facility at MIT before joining Panalytical, and hence has extensive hands-on experience with diffraction systems.
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University of Illinois at Urbana-Champaign