You must login before you can run this tool.
Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization
Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.
Versions
| Version | Released | DOI Handle | Published |
|---|---|---|---|
| 1.2.3 | 21 Mar 2014 | doi:10.4231/D35T3G059 | yes |
| 1.2.2 | 04 Mar 2014 | doi:10.4231/D37W67591 | no |
| 1.2.1 | 27 Feb 2014 | doi:10.4231/D3HD7NS74 | no |